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In situ electrical characterization of palladium-based single electron transistors made by electromigration technique
por:
Arzubiaga, L.; Golmar, F.; Llopis, R.; Casanova, F.; Hueso, L. E.
Materias:Electricidad; Electrones; Transistores; Paladio; Electrodos; Aleaciones de níquel; Electrostática
AIP Publishing;2014
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