IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 62, NO. 6, JUNE 2013
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Guest Editorial
The 2012 CPEM was held at Gaylord National Resort at were prompt in revising their papers according to suggestions
National Harbor just outside of Washington, D.C., from 1–6 from the reviewers and editors. The reviewers are also to be
July 2012. Experts working in the field of metrology and its commended for willingly carrying out their tasks in such a
applications gathered to present and discuss the concerns and tight time schedule.
recent advances in areas of metrology and their applications We would like to also thank the session chairs for spending
to real-world situations.
time finding reviewers for all the papers submitted in their
The authors of the 368 presentations (about 55% in sessions. This remains a critical step in the preparation of the
poster sessions) given at the meeting were invited to sub- Special Issue. The CPEM 2012 session chairs are listed as
mit an extended paper for publication in the CPEM 2012 follows.
issue of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. The paper submission process took place from June 18th to July 3rd, 2012.
All papers were submitted electronically using the AllenTrack System, Allen Press Publishing, Lawrence, KS, as for the last conference. Approximately 120 extended papers were submitted and subjected to peer reviews by two or three experts in the field. The reviewers were asked to evaluate the papers, considering their technical and scientific originality, comprehensibility, and so on. In the end, 75 papers were accepted for publication.
For CPEM 2012, the submission process itself seemed to work quite well. There were very few requests from the authors for assistance from the editors. I believe that most of the attendees have become proficient with the intricacies of the Allen-Track system.
I attempted to aid the selection of reviewers for each extended paper by printing out forms for each session listing the papers and authors included in that session with spaces to add reviewers. I believe that this was a help to the selection process, but as has been the case in the past, there are always a number of papers that required the editors to locate some of the reviewers. Also as has happened in the past, there were problems of late reviews, reviewers declining their assignments, and in some cases, the necessity of assigning a third reviewer to reconcile diametrically opposing recommendations.
In the editorial work, I was helped immensely by an Associate Guest Editor, Thomas Lipe, from the National Institute of Standards and Technology (NIST), Gaithersburg, MD, Regis Landim from Instituto Nacional de Metrologia, Qualidade e Tecnologia (INMETRO), Brazil, and Lucas Di Lillo from Instituto Nacional de Tecnología Industrial (INTI), Argentina. Lucas Di Lillo and Regis Landim will be Co-Guest Editors for CPEM 2014 in Rio de Janeiro, Brazil. Thomas Lipe and I processed approximately two-thirds of the papers, while Lucas and Regis split the remaining third. I hope their experience at CPEM 2012 will aid them in the process for CPEM 2014.
Dealing with so many papers in such a short period would not have been possible without the help of many individuals. First of all, we would like to express our appreciation to all authors who submitted papers, particularly to those who
Djamel Allal Rejean Arseneau Svetlana Avramov-Zamurovic Samuel Benz Luciano Brunetti Ilya Budovsky Rene Carranza Laurie Christian Thomas Crowley Marla Dowell Murray Early Ali Eichenberger Chris Eio Randolph Elmquist Luc Erard Peter S. Filipski Nick Fletcher Paul Hale Jari Hallstrom Angel Moreno Hernandez Felipe Hernandez-Marquez Feng-Lei Hong David Howe David Humphreys David Inglis Masanori Ishii Michael Janezic Jan-Theodoor Janssen Blaise Jeanneret Beat Jeckelmann Rolf Judaschke Jin-Seob Kang Alexander Katkov Jeong-Hwan Kim Kyu-Tae Kim Joseph Kinard Andrew Koffman Gregory Kyriazis Héctor Laiz Regis Landim Lucas Di Lillo
LNE, France NRC, Canada U.S. Naval Academy NIST, U.S.A. INRiM, Italy NMIA, Australia CENAM, Mexico MSL, New Zealand NIST, U.S.A. NIST, U.S.A. MSL, New Zealand METAS, Switzerland NPL, U.K. NIST, U.S.A. LNE, France NRC, Canada BIPM, France NIST, U.S.A. MIKES, Finland CENAM, Mexico CENAM, Mexico AIST, Japan NIST, U.S.A. NPL, U.K. NRC, Canada AIST, Japan NIST, U.S.A. NPL, U.K. METAS, Switzerland METAS, Switzerland PTB, Germany KRISS, Korea VNIIM, Russia KRISS, Korea KRISS, Korea NIST, U.S.A. NIST, U.S.A. INMETRO, Brazil INTI, Argentina INMETRO, Brazil INTI, Argentina
Date of current version May 8, 2013. Digital Object Identifier 10.1109/TIM.2013.2256492
J. Mauricio López R.
Zuliang Lu
Alan Madej
0018-9456/$31.00 c 2013 IEEE
CENAM, Mexico NIM, China NRC, Canada
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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 62, NO. 6, JUNE 2013
Antti Manninen James Miall Peter Mohr Tom Nelson Luis Palafox Po Gyu Park François Piquemal Umberto Pogliano Wilfrid Poirier Gert Rietveld Ian Robinson Alain Rufenacht Karl-Erik Rydler
Hansjorg Scherer Stephan Schlamminger Yueyan Shan Haiming Shao Yozo Shimada Martin Sˇ´ıra Eddy So Michael Stock Yi-hua Tang Alejandra Tonina Michal Ulvr Thomas Wallis Yicheng Wang
MIKES, Finland NPL, U.K. NIST, U.S.A. NIST, U.S.A. PTB, Germany KRISS, Korea LNE, France INRiM, Italy LNE, France VSL, The Netherlands NPL, U.K. NIST, U.S.A. SP Technical Research Institute of Sweden PTB, Germany NIST, U.S.A. NMC, Singapore NIM, China AIST, Japan CMI, Czech Republic NRC, Canada BIPM, France NIST, U.S.A. INTI, Argentina CMI, Czech Republic NIST, U.S.A. NIST, U.S.A.
I would like to thank Tae-Weon Kang and Wan-Seop Kim of KRISS for providing the advice and instruction that George Jones received while acting as Associate Guest Editor for CPEM 2010 and which proved valuable in the present task as Guest Editor. We also thank Dean Jarrett,
Helen Fernando, James Randa, and the many National Institute of Standards (NIST) staff members for their indescribable support. We would like to thank Alessandro Ferrero, the Editorin-Chief of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, for the many valuable discussions and suggestions regarding the review process, which will help us improve the process in the future.
We also thank Reta Wehmeier and Cam Ingelin, the Transactions Administrators, for their exceptional work and consistent patience as we assembled this issue.
Finally, we are grateful to Regis Landim of INMETRO, and Lucas Di Lillo of INTI, the Associate Guest Editors for the CPEM 2012 issue, for their assistance and suggestions during the submission process. I wish both of them and their Associate Guest Editor success at CPEM 2014. We are sure that the CPEM 2014 issue is now in good hands.
GEORGE R. JONES, Guest Editor Fundamental Electrical Measurements Group National Institute of Standards and Technology Gaithersburg, MD 20899 USA
THOMAS LIPE, Associate Guest Editor National Institute of Standards and Technology Gaithersburg, MD 20899 USA
REGIS LANDIM, Associate Guest Editor INMETRO Rio de Janeiro, RJ 20261-232 Brazil
LUCAS Di LILLO, Associate Guest Editor INTI, Casilla de correo, 157 (B1650KNA) San Martín, Argentina
George R. Jones, received the B.S. degree from Wake Forest University, Winston-Salem, NC, in 1976 and the Ph.D. degree in physics from the University of Virginia, Charlottesville, in 1983.
Since January 1983, he has been with the National Institute of Standards and Technology (NIST), Gaithersburg, MD. Initially, he worked with E. R. Williams on the gyromagnetic ratio of the proton. Subsequently, he helped develop new measurement standards to be used to characterize flat-panel displays for original equipment manufacturers and end users. Since 1997, he has been involved with the Metrology of the Ohm group. His areas of research involved the temperature and pressure characterization of precision 1- resistors, writing the control software for the cryogenic current comparators used in the NIST resistance laboratory, and most recently, the grapheme project at NIST.
Thomas Lipe, Lipe received the B.S. degree in physics from East Carolina University in 1980 and the M.S. degree in physics, from the Catholic University of America in 1994.
He joined the staff of the National Institute of Standards and Technology (NIST), formerly NBS, in 1983 to design and construct an automated system for measuring thermal converters. He is currently a Physicist and Project Leader in the NIST Quantum Measurement Division. His current research interests include fabrication of new thermal sensors, quantum-based electrical standards, and the use of cryogenic standards for ac-dc difference metrology.
Mr. Lipe was a co-recipient of the U.S. Department of Commerce Gold Medal in 2007, and is a frequent NVLAP assessor.
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Regis Landim, was born in Rio de Janeiro, Brazil, on April 6, 1970. He received the B.S. degree in electrical engineering from the Universidade Federal de Pernambuco (1996) and the Ph.D. degree in electrical engineering from the Universidade Federal de Minas Gerais (2000), in Brazil.
In 2002, he joined the National Institute of Metrology, Quality and Technology (INMETRO), where, since 2012, he has been the Head of Quantum Electrical Metrology Laboratory. From 2006 to 2007, he collaborated with the National Institute of Standards and Technology, Boulder, CO, as a Guest Researcher in Josephson Systems. His current research interests include ac and dc Josephson voltage standards and its applications in metrology, ac-dc transfer standards, and power and energy metrology. He is responsible for the dissemination of the Brazil legal volt and ampère and for maintaining internationally consistent and traceable voltage and current standards tied to the SI units.
Lucas Di Lillo was born in Argentina in 1970. He received the degree in Physics from the University of Buenos Aires, Argentina, in 2001.
In 1994, he joined the Instituto Nacional de Tecnología Industrial (INTI), Argentina, where he worked in the Dielectric Laboratory. From 2000 to 2008, he was in charge of the AC-DC Transfer and Power Laboratory at INTI. He has been a Guest Scientist at the Physikalisch -Technische Bundesanstalt, Germany in 2005. He has been the head of the Electricity Division at INTI since September 2008.
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